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- Title
A 177 ppm RMS Error-Integrated Interface for Time-Based Impedance Spectroscopy of Sensors.
- Authors
Radogna, Antonio Vincenzo; Capone, Simonetta; Francioso, Luca; Siciliano, Pietro Aleardo; D'Amico, Stefano
- Abstract
This paper presents an integrated circuit for time-based electrical impedance spectroscopy (EIS) of sensors. The circuit exploits maximum-length sequences (MLS) in order to perform a broadband excitation of the sensors under test. Therefore, the measured time-domain EIS is obtained by cross-correlating the input with the output of the analog front end (AFE). Unlike the conventional digital approach, the cross-correlation operation is performed in the analog domain. This leads to a lower RMS error in the measured time-domain EIS since the signal processing is not affected by the quantization noise of the analog-to-digital converter (ADC). It also relaxes the sampling frequency of the ADC leading, along with the lack of random access memory (RAM) usage, to a reduced circuit complexity. Theoretical concepts about the circuit's design and operation are presented, with an emphasis on the thermal noise phenomenon. The simulated performances are shown by testing a sensor's equivalent model composed of a 50 kΩ resistor in parallel with a 100 p F capacitor. A time-based EIS output of 255 points was obtained with a maximum tested frequency of 500 k Hz and a simulated RMS error of 0.0177% (or 177 ppm).
- Subjects
IMPEDANCE spectroscopy; CIRCUIT complexity; RANDOM access memory; SIGNAL processing; ELECTRIC impedance; TIME-resolved spectroscopy
- Publication
Electronics (2079-9292), 2022, Vol 11, Issue 22, p3807
- ISSN
2079-9292
- Publication type
Article
- DOI
10.3390/electronics11223807