Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleForget About Cleaning up Your Micrographs: Deep Learning Segmentation is Robust to Image Artifacts.AuthorsDong, Peng; Provencher, Benjamin; Basim, Nabil; Piché, Nicolas; Marsh, MikePublicationMicroscopy & Microanalysis, 2020, Vol 26, Issue S2, p1468ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927620018231