We found a match
Your institution may have rights to this item. Sign in to continue.
- Title
Spectrum Simulation in DTSA-II.
- Authors
Ritchie, Nicholas W. M.
- Abstract
Spectrum simulation is a useful practical and pedagogical tool. Particularly with complex samples or trace constituents, a simulation can help to understand the limits of the technique and the instrument parameters for the optimal measurement. DTSA-II, software for electron probe microanalysis, provides both easy to use and flexible tools for simulating common and less common sample geometries and materials. Analytical models based on Φ(ρz) curves provide quick simulations of simple samples. Monte Carlo models based on electron and X-ray transport provide more sophisticated models of arbitrarily complex samples. DTSA-II provides a broad range of simulation tools in a framework with many different interchangeable physical models. In addition, DTSA-II provides tools for visualizing, comparing, manipulating, and quantifying simulated and measured spectra.
- Subjects
MICROCHEMISTRY; MONTE Carlo method; X-rays; SPECTRUM analysis; ELECTRONS
- Publication
Microscopy & Microanalysis, 2009, Vol 15, Issue 5, p454
- ISSN
1431-9276
- Publication type
Article
- DOI
10.1017/S1431927609990407