We found a match
Your institution may have rights to this item. Sign in to continue.
- Title
Single-defect spectroscopy in the shortwave infrared.
- Authors
Wu, Xiaojian; Kim, Mijin; Qu, Haoran; Wang, YuHuang
- Abstract
Chemical defects that fluoresce in the shortwave infrared open exciting opportunities in deep-penetration bioimaging, chemically specific sensing, and quantum technologies. However, the atomic size of defects and the high noise of infrared detectors have posed significant challenges to the studies of these unique emitters. Here we demonstrate high throughput single-defect spectroscopy in the shortwave infrared capable of quantitatively and spectrally resolving chemical defects at the single defect level. By cooling an InGaAs detector array down to −190 °C and implementing a nondestructive readout scheme, we are able to capture low light fluorescent events in the shortwave infrared with a signal-to-noise ratio improved by more than three orders-of-magnitude. As a demonstration, we show it is possible to resolve individual chemical defects in carbon nanotube semiconductors, simultaneously collecting a full spectrum for each defect within the entire field of view at the single defect limit. Chemical defects endow materials with unique properties but their investigation is challenging due to their small footprint. Here the authors develop a high throughput shortwave infrared spectroscopy method enabling spectral identification and quantitative counting of fluorescent chemical defects at the single defect level.
- Publication
Nature Communications, 2019, Vol 10, Issue 1, pN.PAG
- ISSN
2041-1723
- Publication type
Article
- DOI
10.1038/s41467-019-10788-8