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- Title
Simulation of the Stepped Surface of a High-Resolution X-ray Diffractor.
- Authors
Mazuritsky, M. I.; Latush, E. M.; Soldatov, A. V.; Ugol’nitskiı, G. A.; Lyashenko, V. L.; Marcelli, A.
- Abstract
Three possible schemes of a high-resolution stepped X-ray diffractor have been analyzed, including those based on the steps of equal angular widths, the steps of equal heights (i.e., distances from the step edge to the beginning of the next step), and the symmetric steps (where a distance from the step edge to the focusing circumference is equal to the distance from the focusing circumference to the edge of the next step). It is shown that the first and the third schemes provide most stable characteristics.
- Subjects
X-ray diffractometers; CRYSTALS
- Publication
Technical Physics Letters, 2000, Vol 26, Issue 6, p502
- ISSN
1063-7850
- Publication type
Article
- DOI
10.1134/1.1262891