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- Title
Identification of RAPD and SCAR markers linked to northern leaf blight resistance in waxy corn ( Zea mays var. ceratina).
- Authors
Khampila, Juthaporn; Lertrat, Kamol; Saksirirat, Weerasak; Sanitchon, Jirawat; Muangsan, Nooduan; Theerakulpisut, Piyada
- Abstract
Exserohilum turcicum causes northern corn leaf blight (NCLB), an important disease occurring in maize producing areas throughout the world. Currently, the development of cultivars resistant to E. turcicum seems to be the most efficient method to control NCLB damage. Marker-assisted selection (MAS) enables breeders to improve selection efficiency. The objective of this work was to identify random amplified polymorphic DNA (RAPD) and sequence characterized amplified region (SCAR) markers associated with NCLB resistance. Bulked segregant analysis (BSA) was used to search for RAPD markers linked to NCLB resistance genes, using F2 segregating population obtained by crossing a susceptible inbred ‘209W’ line with a resistant inbred ‘241W’ line. Two hundred and twenty-two decamer primers were screened to identify four RAPD markers: OPA07521, OPA16457, OPB09520, and OPE20536 linked to NCLB resistance phenotype. These markers were converted into dominant SCAR markers: SCA07496, SCA16420, SCB09464, and SCE20429, respectively. The RAPD and SCAR markers were developed successfully to identify NCLB resistant genotypes in segregating progenies carrying NCLB resistant traits. Thus, the markers identified in this study should be applicable for MAS for the NCLB resistance in waxy corn breeding programs.
- Subjects
CORN; FUNGAL diseases of plants; DNA; PLANT genetics; BIOMARKERS
- Publication
Euphytica, 2008, Vol 164, Issue 3, p615
- ISSN
0014-2336
- Publication type
Article
- DOI
10.1007/s10681-008-9647-z