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- Title
An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography.
- Authors
Thuvander, Mattias; Meisenkothen, Frederick; Sha, Gang; Peng, Zirong; Lu, Yifeng; Hatzoglou, Constantinos; Kwiatkowski da Silva, Alisson; Vurpillot, Francois; Ponge, Dirk; Raabe, Dierk; Gault, Baptiste
- Abstract
We introduce an efficient, automated computational approach for analyzing interfaces within atom probe tomography datasets, enabling quantitative mapping of their thickness, composition, as well as the Gibbsian interfacial excess of each solute. Detailed evaluation of an experimental dataset indicates that compared with the composition map, the interfacial excess map is more robust and exhibits a relatively higher resolution to reveal compositional variations. By field evaporation simulations with a predefined emitter mimicking the experimental dataset, the impact of trajectory aberrations on the measurement of the thickness, composition, and interfacial excess of the decorated interface are systematically analyzed and discussed.
- Publication
Microscopy & Microanalysis, 2019, Vol 25, Issue 2, p389
- ISSN
1431-9276
- Publication type
Article
- DOI
10.1017/S1431927618016112