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- Title
Summary of ISO/TC 201 standard: ISO 19668-Surface chemical analysis-X-ray photoelectron spectroscopy-Estimating and reporting detection limits for elements in homogeneous materials.
- Authors
Shard, A. G.; Clifford, C. A.
- Abstract
This International Standard specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.
- Subjects
DETECTION limit; CHEMICAL detectors; HOMOGENEOUS catalysis; X-ray photoelectron spectroscopy; MATHEMATICAL models of uncertainty
- Publication
Surface & Interface Analysis: SIA, 2018, Vol 50, Issue 1, p87
- ISSN
0142-2421
- Publication type
Article
- DOI
10.1002/sia.6339