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- Title
Impedance Spectroscopy Characterization in Bipolar Ta/ MnO<sub> x</sub>/ Pt Resistive Switching Thin Films.
- Authors
Park, Chan ‐ Rok; Choi, Sun ‐ Young; You, Yil ‐ Hwan; Yang, Min Kyu; Bae, Seung ‐ Muk; Lee, Jeon ‐ Kook; Hwang, Jin ‐ Ha; Goyal, A.
- Abstract
Impedance spectroscopy was applied to MnO x-based thin films prepared in symmetric and asymmetric electrode configurations, i.e., Pt/ MnO x/ Pt and Ta/ MnO x/ Pt, respectively. Equivalent circuit analysis suggests the presence of higher resistance surface layers adjacent the electrodes, in addition to a higher conductivity component at central portions of the MnO x thin films. The asymmetric configuration enables the Ta/ MnO x interfacial layer to facilitate the redox transport of oxygen ions, where significant changes in resistance with the electric field are responsible for the higher on/off resistance ratio in Ta/ MnO x/ Pt. The higher dielectric constant and bias-dependent capacitance and resistance support the coexistence of both oxidized surfaces and interfacial layers.
- Subjects
IMPEDANCE spectroscopy; THIN films; ELECTRODES; ELECTRIC conductivity; OXYGEN; DIELECTRICS
- Publication
Journal of the American Ceramic Society, 2013, Vol 96, Issue 4, p1234
- ISSN
0002-7820
- Publication type
Article
- DOI
10.1111/jace.12185