Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleDefect engineering of the electronic transport through cuprous oxide interlayers.AuthorsFadlallah, Mohamed M.; Eckern, Ulrich; Schwingenschlögl, UdoPublicationScientific Reports, 2016, p27049ISSN2045-2322Publication typeArticleDOI10.1038/srep27049