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- Title
Low-temperature photoluminescence of ion-implanted SiO:Sn films and glasses.
- Authors
Zatsepin, A.; Buntov, E.; Kortov, V.; Pustovarov, V.; Fitting, H.; Schmidt, B.; Gavrilov, N.
- Abstract
Low-temperature photoluminescence spectroscopy with pulsed synchrotron excitation is applied to study the regularities of excitation and relaxation of both point defects and nanoparticles formed by tin implantation into SiO films and glasses. It has been found that tin implantation followed by air and nitrogen annealing yields the formation of α-Sn nanoclusters and nonstoichiometric SnO nanoparticles, while a stable phase of SnO does not appear. Alternative channels of luminescence excitation are revealed for nanoclusters, including energy transfer from excitons and electron-hole pairs of the host SiO matrix.
- Publication
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, Vol 6, Issue 4, p668
- ISSN
1027-4510
- Publication type
Article
- DOI
10.1134/S1027451012080198