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- Title
Generation of 1/f spectrum by relaxation process in thin film resistors.
- Authors
Hashiguchi, Sumihisa; Yamagishi, Yutaka; Fukuda, Toshiyuki; Ohki, Makoto; Šikula, Josef; Vašina, Petr
- Abstract
Relaxation processes with various time constants generate a 1/f spectrum when they are driven by a single random time series. Such simple processes may be the origin of the noise generated in some kinds of thin film resistors. © 1998 John Wiley & Sons, Ltd.
- Subjects
THIN films; THIN film devices; FILM resistors; ELECTRIC resistors; NOISE; RELIABILITY in engineering
- Publication
Quality & Reliability Engineering International, 1998, Vol 14, Issue 2, p69
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/(SICI)1099-1638(199803/04)14:2<69::AID-QRE161>3.0.CO;2-4