We found a match
Your institution may have rights to this item. Sign in to continue.
- Title
Electron ptychographic microscopy for three-dimensional imaging.
- Authors
Si Gao; Peng Wang; Fucai Zhang; Martinez, Gerardo T.; Nellist, Peter D.; Xiaoqing Pan; Kirkland, Angus I.
- Abstract
Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corresponding depth resolution of about 24–30 nm. This three-dimensional imaging method has potential applications for the three-dimensional structure determination of a range of objects, ranging from inorganic nanostructures to biological macromolecules.
- Publication
Nature Communications, 2017, Vol 8, Issue 1, p1
- ISSN
2041-1723
- Publication type
Article
- DOI
10.1038/s41467-017-00150-1