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- Title
RAMAN SPECTROSCOPY OF GeSe AND AgGeSe THIN FILMS.
- Authors
GARRIDO, J. M. CONDE; PIARRISTEGUY, A.; PARC, R. LE; UREÑA, M. A.; FONTANA, M.; ARCONDO, B.; PRADEL, A.
- Abstract
The structural properties of Agy(Ge0.25Se0.75)1-y thin films (y=0, 0.07, 0.10, 0.15, 0.20 and 0.25 at. fraction) were studied. The films were prepared by pulsed laser deposition using bulk glass targets of the studied ternary system and deposited onto microscope slides. Their amorphous structures were confirmedby XRD (X-ray Diffraction). The effect of silver content on films structures was analysedby Raman spectroscopy. Typical Raman vibration modes were observed in the Ge0.25Se0.75 binary film: Ge-Se corner-sharing tetrahedra mode (CS) at 199 cm-1, edge sharing tetrahedra mode (ES) at 217 cm-1, and Se-Se rings and chains mode at 255-265 cm-1 (CM). In the Agy(Ge0.25Se0.75)1-y ternary thin films, the same modes were observed but with a red shift and an intensity reduction in the ES and CM bands.
- Subjects
GERMANIUM compounds; THIN films; SILVER compounds; PULSED laser deposition; RAMAN spectroscopy; X-ray diffraction; TERNARY system
- Publication
Chalcogenide Letters, 2013, Vol 10, Issue 11, p427
- ISSN
1841-4834
- Publication type
Article