Statistical Analysis of Thermal Treatment Effect of SMD Ni-RTD Batch Sensors and Its Direct Application Without Packaging for a Contact Thermometer.

Published in:

Journal of Electronic Materials, 2022, v. 51, n. 4, p. 1481, doi. 10.1007/s11664-022-09440-x

By:

• Chavez-Urbiola, I. R.;
• Sánchez-Fraga, R.;
• Mejia, I.;
• Leon-Gil, J. A.;
• Ponce-Hernández, J.;
• Velarde-Díaz, L. D.;
• Alcantar-Peña, Jesús J.

Publication type:

Article