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- Title
Modeling control over determination of dielectric properties by the perturbation technique.
- Authors
Komarov, Vyacheslav V.; Yakovlev, Vadim V.
- Abstract
An accompanying numerical simulation for obtaining field patterns, resonant frequencies, and the Q factor is proposed to evaluate the experimental conditions of complex permittivity reconstruction by the perturbation method and thereby improve its accuracy and flexibility. This approach is illustrated by analyzing the measurement of dielectric constant and the loss tangent of wet movie film in a rectangular resonator. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 39: 443–446, 2003
- Subjects
DIELECTRICS; EXCITON theory; PERTURBATION theory; MICROWAVE devices; MICROWAVES
- Publication
Microwave & Optical Technology Letters, 2003, Vol 39, Issue 6, p443
- ISSN
0895-2477
- Publication type
Article
- DOI
10.1002/mop.11243