We found a match
Your institution may have rights to this item. Sign in to continue.
- Title
Degradation model analysis of laser diodes.
- Authors
Häusler, K.; Zeimer, U.; Sumpf, B.; Erbert, G.; Tränkle, G.
- Abstract
Broad area laser diodes were subjected to accelerated aging until most devices failed. Cathodoluminescence images indicate dark spots after gradual degradation and dark lines after sudden failure. The aging curves were analyzed based on recombination enhanced defect generation and the Eyring model. The data were statistically evaluated by log-normal distribution of failure time and by nonlinear mixed-effects of degradation parameters. The reliability is estimated for long term device operation.
- Subjects
LASERS; CATHODOLUMINESCENCE; LOGNORMAL distribution; DISTRIBUTION (Probability theory); MULTILEVEL models; MATHEMATICAL models; PARAMETER estimation
- Publication
Journal of Materials Science: Materials in Electronics, 2008, Vol 19, p160
- ISSN
0957-4522
- Publication type
Article
- DOI
10.1007/s10854-007-9534-8