Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleCharacterization of Edge Contact: Atomically Resolved Semiconductor-Metal Lateral Boundary in MoS<sub>2</sub>.AuthorsKwon, Hyeokshin; Lee, Kiyoung; Heo, Jinseong; Oh, Youngtek; Lee, Hyangsook; Appalakondaiah, Samudrala; Ko, Wonhee; Kim, Hyo Won; Jung, Jin‐Wook; Suh, Hwansoo; Min, Hongki; Jeon, Insu; Hwang, Euyheon; Hwang, SungwooPublicationAdvanced Materials, 2017, Vol 29, Issue 41, pn/aISSN0935-9648Publication typeArticleDOI10.1002/adma.201702931