Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.Title32‐1: Improving QD Backplane Defect Image Generation Using Automatic Masking in Diffusion Models.AuthorsPan, Zhihong; Shenoy, Rahul; Balakrishnan, Kaushik; Cheng, Qisen; Lee, Janghwan; Jeon, Yongmoon; Jeong, Deokyeong; Kim, JaewonPublicationSID Symposium Digest of Technical Papers, 2024, Vol 55, Issue 1, p409ISSN0097-966XPublication typeArticleDOI10.1002/sdtp.17544