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- Title
And the Winners Are…Results of the EDFAS 2008 Board of Directors, Election.
- Authors
Ross, Dick
- Abstract
The article presents the results of the Electronic Device Failure Analysis Society (EDFAS) 2008 Board of Directors' election. Elected to a four-year term, beginning September 1, 2008, and ending August 31, 2012, joining EDFAS President Tracy Myers and Immediate Past-President Gary Shade, are Vice-President/President-Elect Thomas Moore of Omniprobe, Inc., Secretary Jeremy Walraven of Sandia National Laboratories, and Financial Officer Lee Knauss of Booz Allen Hamilton, Inc. They will be officially presented to the Society at International Symposium for Testing and Failure Analysis (ISTFA). Furthermore, the continuing Board members include Philippe Perdu of CNES France, Matthew Thayer of Advanced Micro Devices, and David Vallett of IBM Systems and Technology Group.
- Subjects
ASSOCIATIONS, institutions, etc.; BOARDS of directors; ELECTIONS; MYERS, Tracy; SHADE, Gary; MOORE, Thomas, 1779-1852; KNAUSS, Lee; SANDIA National Laboratories; BOOZ Allen Hamilton
- Publication
Electronic Device Failure Analysis, 2008, Vol 10, Issue 4, p42
- ISSN
1537-0755
- Publication type
Article