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- Title
QTL mapping for yield and yield contributing traits in two mapping populations of bread wheat.
- Authors
Kumar, N.; Kulwal, P. L.; Balyan, H. S.; Gupta, P. K.
- Abstract
In bread wheat, single-locus and two-locus QTL analyses were conducted for seven yield and yield contributing traits using two different mapping populations (P I and P II). Single-locus QTL analyses involved composite interval mapping (CIM) for individual traits and multiple-trait composite interval mapping (MCIM) for correlated yield traits to detect the pleiotropic QTLs. Two-locus analyses were conducted to detect main effect QTLs (M-QTLs), epistatic QTLs (E-QTLs) and QTL × environment interactions (QE and QQE). Only a solitary QTL for spikelets per spike was common between the above two populations. HomoeoQTLs were also detected, suggesting the presence of triplicate QTLs in bread wheat. Relatively fewer QTLs were detected in P I than in P II. This may be partly due to low density of marker loci on P I framework map (173) than in P II (521) and partly due to more divergent parents used for developing P II. Six QTLs were important which were pleiotropic/coincident involving more than one trait and were also consistent over environments. These QTLs could be utilized efficiently for marker assisted selection (MAS).
- Subjects
INDIA; WHEAT; PLANT gene mapping; PLANT chromosomes; GENOMES; PHENOTYPES
- Publication
Molecular Breeding, 2007, Vol 19, Issue 2, p163
- ISSN
1380-3743
- Publication type
Article
- DOI
10.1007/s11032-006-9056-8