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In situ X-ray absorption spectroscopy of Sn species adsorbed on platinized platinum electrode in perchloric acid solution containing stannous ions.
Published in:
Journal of Solid State Electrochemistry, 2019, v. 23, n. 7, p. 2261, doi. 10.1007/s10008-019-04326-1
By:
- Seo, M.;
- Habazaki, H.;
- Inaba, M.;
- Yokomizo, M.;
- Nakayama, T.
Publication type:
Article
Highly increased capacitance and thermal stability of anodic oxide films on oxygen-incorporated Zr-Ti alloy.
Published in:
Journal of Solid State Electrochemistry, 2017, v. 21, n. 10, p. 2807, doi. 10.1007/s10008-017-3607-2
By:
- Habazaki, H.;
- Kobayashi, K.;
- Tsuji, E.;
- Zhu, C.;
- Aoki, Y.;
- Nagata, S.
Publication type:
Article
Effect of current density and behaviour of second phases in anodizing of a Mg-Zn-RE alloy in a fluoride/glycerol/water electrolyte.
Published in:
Journal of Solid State Electrochemistry, 2016, v. 20, n. 4, p. 1155, doi. 10.1007/s10008-015-2864-1
By:
- Němcová, A.;
- Kuběna, I.;
- Šmíd, M.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G.
Publication type:
Article
Physicochemical characterization and photoelectrochemical analysis of iron oxide films.
Published in:
Journal of Solid State Electrochemistry, 2013, v. 17, n. 12, p. 3005, doi. 10.1007/s10008-013-2131-2
By:
- Santamaria, M.;
- Terracina, S.;
- Konno, Y.;
- Habazaki, H.;
- Di Quarto, F.
Publication type:
Article
Factors influencing the growth behaviour of nanoporous anodic films on iron under galvanostatic anodizing.
Published in:
Journal of Solid State Electrochemistry, 2012, v. 16, n. 12, p. 3887, doi. 10.1007/s10008-012-1833-1
By:
- Konno, Y.;
- Tsuji, E.;
- Skeldon, P.;
- Thompson, G.;
- Habazaki, H.
Publication type:
Article
Growth and field crystallization of anodic films on Ta-Nb alloys.
Published in:
Journal of Solid State Electrochemistry, 2012, v. 16, n. 4, p. 1595, doi. 10.1007/s10008-011-1565-7
By:
- Komiyama, S.;
- Tsuji, E.;
- Aoki, Y.;
- Habazaki, H.;
- Santamaria, M.;
- Quarto, F.;
- Skeldon, P.;
- Thompson, G.
Publication type:
Article
Growth of porous anodic alumina films in hot phosphate-glycerol electrolyte.
Published in:
Journal of Solid State Electrochemistry, 2011, v. 15, n. 4, p. 689, doi. 10.1007/s10008-010-1141-6
By:
- Yang, S.;
- Aoki, Y.;
- Skeldon, P.;
- Thompson, G. E.;
- Habazaki, H.
Publication type:
Article
Observation of self-assembled layers of alkyl phosphonic acid on aluminum using low-voltage scanning electron microscopy and AFM.
Published in:
Surface & Interface Analysis: SIA, 2013, v. 45, n. 10, p. 1441, doi. 10.1002/sia.5217
By:
- Sato, H.;
- Fujii, T.;
- Tsuji, E.;
- Aoki, Y.;
- Shimizu, K.;
- Skeldon, P.;
- Thompson, G.E.;
- Habazaki, H.
Publication type:
Article
Incorporation and migration of phosphorus species within anodic films on an Al-W alloy.
Published in:
Surface & Interface Analysis: SIA, 2011, v. 43, n. 5, p. 893, doi. 10.1002/sia.3651
By:
- Garcia-Vergara, S. J.;
- Molchan, I. S.;
- Zhou, F.;
- Habazaki, H.;
- Kowalski, D.;
- Skeldon, P.;
- Thompson, G. E.
Publication type:
Article
Analysis of anodic films on Nb and NbNx by glow discharge optical emission spectroscopy.
Published in:
Surface & Interface Analysis: SIA, 2003, v. 35, n. 7, p. 618, doi. 10.1002/sia.1583
By:
- H. Habazaki;
- T. Matsuo;
- H. Konno;
- K. Shimizu;
- K. Matsumoto;
- K. Takayama;
- Y. Oda;
- P. Skeldon;
- G. E. Thompson
Publication type:
Article
Radiofrequency GDOES: a powerful technique for depth profiling analysis of thin films.
Published in:
Surface & Interface Analysis: SIA, 2003, v. 35, n. 7, p. 564, doi. 10.1002/sia.1572
By:
- K. Shimizu;
- H. Habazaki;
- P. Skeldon;
- G. E. Thompson
Publication type:
Article
Radiofrequency GDOES, EPMA and AES analysis of zinc die casting plated with copper, duplex nickel and microporous chromium for corrosion protection.
Published in:
Surface & Interface Analysis: SIA, 2003, v. 35, n. 7, p. 611, doi. 10.1002/sia.1582
By:
- K. Shimizu;
- N. Kasahara;
- H. Habazaki;
- P. Skeldon;
- G. E. Thompson
Publication type:
Article
Dielectric and mechanical properties of anodic films in the TaTi system.
Published in:
Surface & Interface Analysis: SIA, 2003, v. 35, n. 5, p. 477, doi. 10.1002/sia.1549
By:
- S. Mato;
- G. Alcalá;
- P. Skeldon;
- G. E. Thompson;
- A. B. Mann;
- D. Masheder;
- H. Habazaki;
- K. Shimizu
Publication type:
Article
Surface nanotextures on aluminium.
Published in:
Surface & Interface Analysis: SIA, 2002, v. 34, n. 1, p. 405, doi. 10.1002/sia.1327
By:
- Caicedo-Martinez, C. E.;
- Koroleva, E. V.;
- Thompson, G. E.;
- Skeldon, P.;
- Shimizu, K.;
- Habazaki, H.;
- Hoellrigl, G.
Publication type:
Article
Detachment of alumina films from aluminium by 100 keV H+ ions.
Published in:
Surface & Interface Analysis: SIA, 2002, v. 33, n. 4, p. 318, doi. 10.1002/sia.1197
By:
- Liu, Y.;
- Alexander, M.;
- Koroleva, E.;
- Skeldon, P.;
- Thompson, G. E.;
- Bailey, P.;
- Noakes, T. C. Q.;
- Shimizu, K.;
- Habazaki, H.
Publication type:
Article
Radio frequency GDOES depth profiling analysis of a B-doped diamond film deposited onto Si by microwave plasma CVD.
Published in:
Surface & Interface Analysis: SIA, 2002, v. 33, n. 1, p. 35, doi. 10.1002/sia.1158
By:
- Shimizu, K.;
- Einaga, Y.;
- Ohnishi, K.;
- Fujishima, A.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.
Publication type:
Article
Reproducibility in r.f.-GDOES depth profiling analysis of thin films.
Published in:
Surface & Interface Analysis: SIA, 2001, v. 31, n. 12, p. 1085, doi. 10.1002/sia.1148
By:
- Shimizu, K.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.
Publication type:
Article
Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films.
Published in:
Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 869, doi. 10.1002/sia.1120
By:
- Shimizu, K.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.;
- Marcus, R. K.
Publication type:
Article
Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering.
Published in:
Surface & Interface Analysis: SIA, 2001, v. 31, n. 6, p. 480, doi. 10.1002/sia.1098
By:
- Bailey, P.;
- Skeldon, P.;
- Noakes, T. C. Q.;
- Thompson, G. E.;
- Sakairi, M.;
- Habazaki, H.;
- Shimizu, K.
Publication type:
Article
Behaviour of copper and generation of oxygen during anodizing of Nb-Cu alloys.
Published in:
Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 895, doi. 10.1002/1096-9918(200012)29:12<895::AID-SIA944>3.0.CO;2-W
By:
- Mato, S.;
- Skeldon, P.;
- Thompson, G. E.;
- Masheder, D.;
- Sproule, G. I.;
- Graham, M. J.;
- Habazaki, H.;
- Shimizu, K.
Publication type:
Article
GDOES depth profiling analysis and cross-sectional transmission electron microscopy of a hard disk.
Published in:
Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 887, doi. 10.1002/1096-9918(200012)29:12<887::AID-SIA942>3.0.CO;2-X
By:
- Shimizu, K.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.
Publication type:
Article
GDOES depth profiling analysis of the air-formed oxide film on a sputter-deposited Type 304 stainless steel.
Published in:
Surface & Interface Analysis: SIA, 2000, v. 29, n. 11, p. 743, doi. 10.1002/1096-9918(200011)29:11<743::AID-SIA921>3.0.CO;2-Q
By:
- Shimizu, K.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.;
- Wood, G. C.
Publication type:
Article
GDOES depth profiling analysis of amorphous Ni-P-plated aluminium hard disks.
Published in:
Surface & Interface Analysis: SIA, 2000, v. 29, n. 2, p. 151, doi. 10.1002/(SICI)1096-9918(200002)29:2<151::AID-SIA728>3.0.CO;2-V
By:
- Shimizu, K.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.;
- Wood, G. C.
Publication type:
Article
Influence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films.
Published in:
Surface & Interface Analysis: SIA, 2000, v. 29, n. 2, p. 155, doi. 10.1002/(SICI)1096-9918(200002)29:2<155::AID-SIA729>3.0.CO;2-G
By:
- Shimizu, K.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.;
- Wood, G. C.
Publication type:
Article
Comparison of depth profiling analysis of a thick, electrolytically-coloured porous alumina film by EPMA and GDOES.
Published in:
Surface & Interface Analysis: SIA, 1999, v. 27, n. 12, p. 1046, doi. 10.1002/(SICI)1096-9918(199912)27:12<1046::AID-SIA673>3.0.CO;2-X
By:
- Shimizu, K.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.;
- Wood, G. C.
Publication type:
Article
GDOES depth profiling analysis of a thin surface film on aluminium.
Published in:
Surface & Interface Analysis: SIA, 1999, v. 27, n. 11, p. 998, doi. 10.1002/(SICI)1096-9918(199911)27:11<998::AID-SIA667>3.0.CO;2-1
By:
- Shimizu, K.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.;
- Wood, G. C.
Publication type:
Article
Non-uniform sputtering and degradation of depth resolution during GDOES depth profiling analysis of thin anodic alumina films grown over rough substrates.
Published in:
Surface & Interface Analysis: SIA, 1999, v. 27, n. 10, p. 950, doi. 10.1002/(SICI)1096-9918(199910)27:10<950::AID-SIA658>3.0.CO;2-X
By:
- Shimizu, K.;
- Habazaki, H.;
- Skeldon, P.;
- Thompson, G. E.;
- Wood, G. C.
Publication type:
Article
Influence of surface roughness on the depth resolution of GDOES depth profiling analysis.
Published in:
Surface & Interface Analysis: SIA, 1999, v. 27, n. 3, p. 153, doi. 10.1002/(SICI)1096-9918(199903)27:3<153::AID-SIA494>3.0.CO;2-#
By:
- Shimizu, K.;
- Brown, G. M.;
- Habazaki, H.;
- Kobayashi, K.;
- Skeldon, P.;
- Thompson, G. E.;
- Wood, G. C.
Publication type:
Article
Elastic recoil detection analysis (ERDA), RBS and TEM study of barrier film formation on Al-4.5 at.% Mg-0.05 at.% Cu alloy.
Published in:
Surface & Interface Analysis: SIA, 1999, v. 27, n. 1, p. 57, doi. 10.1002/(SICI)1096-9918(199901)27:1<57::AID-SIA464>3.0.CO;2-J
By:
- Thompson, G. E.;
- Skeldon, P.;
- Wood, G. C.;
- Zhou, X.;
- Kreissig, U.;
- Wieser, E.;
- Habazaki, H.;
- Shimizu, K.
Publication type:
Article
Glow discharge optical emission spectrometry (GDOES) depth profiling analysis of anodic alumina films-a depth resolution study.
Published in:
Surface & Interface Analysis: SIA, 1999, v. 27, n. 1, p. 24, doi. 10.1002/(SICI)1096-9918(199901)27:1<24::AID-SIA457>3.0.CO;2-N
By:
- Shimizu, K.;
- Brown, G. M.;
- Habazaki, H.;
- Kobayashi, K.;
- Skeldon, P.;
- Thompson, G. E.;
- Wood, G. C.
Publication type:
Article
Oxidation of copper and mobility of copper ions during anodizing of an Al-1.5 wt.% Cu alloy.
Published in:
Surface & Interface Analysis: SIA, 1995, v. 23, n. 13, p. 892, doi. 10.1002/sia.740231307
By:
- Habazaki, H.;
- Shimizu, K.;
- Paez, M. A.;
- Skeldon, P.;
- Thompson, G. E.;
- Wood, G. C.;
- Xhou, X.
Publication type:
Article
Methanation of carbon dioxide on Ni/(Zr-Sm)O x catalysts.
Published in:
Applied Organometallic Chemistry, 2000, v. 14, n. 12, p. 803, doi. 10.1002/1099-0739(200012)14:12<803::AID-AOC89>3.0.CO;2-J
By:
- Habazaki, H.;
- Yamasaki, M.;
- Kawashima, A.;
- Hashimoto, K.
Publication type:
Article
Behaviour of bismuth during simulated processing of model aluminium capacitor foils.
Published in:
Journal of Materials Science, 2001, v. 36, n. 9, p. 2237, doi. 10.1023/A:1017556403288
By:
- Ashitaka, Z.;
- Thompson, G.;
- Skeldon, P.;
- Habazaki, H.;
- Shimizu, K.
Publication type:
Article
Morphology and composition of layered anodic films on InP.
Published in:
Journal of Materials Science, 2001, v. 36, n. 5, p. 1253, doi. 10.1023/A:1004854514323
By:
- Echeverria, F.;
- Skeldon, P.;
- Thompson, G. E.;
- Habazaki, H.;
- Shimizu, K.
Publication type:
Article

Found: 34

In situ X-ray absorption spectroscopy of Sn species adsorbed on platinized platinum electrode in perchloric acid solution containing stannous ions.

Highly increased capacitance and thermal stability of anodic oxide films on oxygen-incorporated Zr-Ti alloy.

Effect of current density and behaviour of second phases in anodizing of a Mg-Zn-RE alloy in a fluoride/glycerol/water electrolyte.

Physicochemical characterization and photoelectrochemical analysis of iron oxide films.

Factors influencing the growth behaviour of nanoporous anodic films on iron under galvanostatic anodizing.

Growth and field crystallization of anodic films on Ta-Nb alloys.

Growth of porous anodic alumina films in hot phosphate-glycerol electrolyte.

Observation of self-assembled layers of alkyl phosphonic acid on aluminum using low-voltage scanning electron microscopy and AFM.

Incorporation and migration of phosphorus species within anodic films on an Al-W alloy.

Analysis of anodic films on Nb and NbN<sub>x</sub> by glow discharge optical emission spectroscopy.

Radiofrequency GDOES: a powerful technique for depth profiling analysis of thin films.

Radiofrequency GDOES, EPMA and AES analysis of zinc die casting plated with copper, duplex nickel and microporous chromium for corrosion protection.

Dielectric and mechanical properties of anodic films in the TaTi system.

Surface nanotextures on aluminium.

Detachment of alumina films from aluminium by 100 keV H<sup>+</sup> ions.

Radio frequency GDOES depth profiling analysis of a B-doped diamond film deposited onto Si by microwave plasma CVD.

Reproducibility in r.f.-GDOES depth profiling analysis of thin films.

Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films.

Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering.

Behaviour of copper and generation of oxygen during anodizing of Nb-Cu alloys.

GDOES depth profiling analysis and cross-sectional transmission electron microscopy of a hard disk.

GDOES depth profiling analysis of the air-formed oxide film on a sputter-deposited Type 304 stainless steel.

GDOES depth profiling analysis of amorphous Ni-P-plated aluminium hard disks.

Influence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films.

Comparison of depth profiling analysis of a thick, electrolytically-coloured porous alumina film by EPMA and GDOES.

GDOES depth profiling analysis of a thin surface film on aluminium.

Non-uniform sputtering and degradation of depth resolution during GDOES depth profiling analysis of thin anodic alumina films grown over rough substrates.

Influence of surface roughness on the depth resolution of GDOES depth profiling analysis.

Elastic recoil detection analysis (ERDA), RBS and TEM study of barrier film formation on Al-4.5 at.% Mg-0.05 at.% Cu alloy.

Glow discharge optical emission spectrometry (GDOES) depth profiling analysis of anodic alumina films-a depth resolution study.

Oxidation of copper and mobility of copper ions during anodizing of an Al-1.5 wt.% Cu alloy.

Methanation of carbon dioxide on Ni/(Zr-Sm)O<sub> x</sub> catalysts.

Behaviour of bismuth during simulated processing of model aluminium capacitor foils.

Morphology and composition of layered anodic films on InP.