Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleMicrostructural Analysis of Si Frameworks Induced by Electrochemical (De)Alloying Process.AuthorsKo, Dong-Su; Ogata, Ken; Jeon, Sungho; Jung, Changhoon; Lee, Junho; Sul, Soohwan; Kim, Hee-Goo; Shin, Jai KwangPublicationMicroscopy & Microanalysis, 2018, Vol 24, p1712ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927618009042