We found a match
Your institution may have rights to this item. Sign in to continue.
- Title
Synthesis and characterization of low particle size nanocrystalline SnSe thin films.
- Authors
El Zawawi, I.; Mahdy, Manal
- Abstract
Tin selenide (SnSe) nanocrystalline thin films of different thickness from 15 to 70 nm were prepared by inert gas condensation technique. Argon gas flow and substrate temperature were kept constant during deposition process at 2 × 10 Torr and 27 °C respectively. Polycrystalline orthorhombic phase structured was deduced for the prepared SnSe ingot powder by X-ray diffraction pattern. The grazing incident in-plane X-ray diffraction (GIIXD) pattern showed nanocrystalline orthorhombic structure for deposited SnSe thin film. The TEM micrographs showed that thin films were nanocrystalline with particle size in the range from 2 to 5.7 nm. The optical band gap E of the thin films due to direct allowed transition have values ranging from 2.5 to 2.13 eV as the particle size increases from 2 to 5.7 nm. The photoconductivity spectra of the nanostructured SnSe thin films of different particle size showed transitions at 2.45, 2.34 and 2.21 eV for films of different particle size.
- Subjects
PARTICLE size distribution; NANOCRYSTAL synthesis; SELENIDES; METALLIC films; THICKNESS measurement; CONDENSATION; X-ray diffraction
- Publication
Journal of Materials Science: Materials in Electronics, 2013, Vol 24, Issue 6, p2106
- ISSN
0957-4522
- Publication type
Article
- DOI
10.1007/s10854-013-1065-x