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- Title
Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer.
- Authors
Yuichi Inubushi; Ichiro Inoue; Jangwoo Kim; Akihiko Nishihara; Satoshi Matsuyama; Hirokatsu Yumoto; Takahisa Koyama; Kensuke Tono; Haruhiko Ohashi; Kazuto Yamauchi; Makina Yabashi
- Abstract
We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 ± 1.1 fs.
- Subjects
X-ray spectra; SPECTROMETERS
- Publication
Applied Sciences (2076-3417), 2017, Vol 7, Issue 6, p584
- ISSN
2076-3417
- Publication type
Article
- DOI
10.3390/app7060584