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- Title
A simple method for the determination of strains in epitaxial films: application to Eu(110) deposited on a Nb(110) buffer.
- Authors
Soriano, S.; Gourieux, T.; Stunault, A.; Dumesnil, K.; Dufour, C.
- Abstract
In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film.
- Subjects
THIN films; SOLID state electronics; THICK films; X-ray diffraction; OPTICAL diffraction
- Publication
European Physical Journal B: Condensed Matter, 2005, Vol 48, Issue 2, p167
- ISSN
1434-6028
- Publication type
Article
- DOI
10.1140/epjb/e2005-00400-4