We found a match
Your institution may have rights to this item. Sign in to continue.
- Title
Thermal expansion behavior of SrSiO and SrSiO determined by high-temperature X-ray diffraction and dilatometry.
- Authors
Thieme, Christian; Rüssel, Christian
- Abstract
Strontium silicates are widely known as high thermal expansion materials, especially from glass ceramic sealing applications. However, the thermal expansion behavior of the pure crystalline phases is still unknown. Hence, SrSiO and SrSiO were characterized with dilatometry and high-temperature X-ray diffraction. The measured coefficients of thermal expansion (CTE) of SrSiO are strongly anisotropic and depending on the crystallographic direction vary between 3.9 and 16.6 × 10 K. SrSiO has a somewhat higher isotropy of thermal expansion than SrSiO. The CTE in the respective crystallographic directions differs by only 1.9 × 10 K. The mean CTE is between 10.9 and 12.8 × 10 K for SrSiO and SrSiO, respectively. A comparison of the Sr-phases with Ba- and Ca-phases with the same stoichiometry is given with respect to the crystal structures and the CTE.
- Subjects
STRONTIUM compounds; THERMAL expansion; HIGH temperature metallurgy; X-ray diffraction; DILATOMETRY
- Publication
Journal of Materials Science, 2015, Vol 50, Issue 16, p5533
- ISSN
0022-2461
- Publication type
Article
- DOI
10.1007/s10853-015-9100-3