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- Title
TEM characterization of MBE grown CdTe/ZnTe axial nanowires.
- Authors
DŁUZEWSKI, P.; JANIK, E.; KRET, S.; ZALESZCZYK, W.; TANG, D.; KARCZEWSKI, G.; WOJTOWICZ, T.
- Abstract
CdTe/ZnTe axial nanowires were successfully fabricated by molecular beam epitaxy with the use of Au nano-catalysts and vapour–liquid–solid growth mechanism. Nanowires had zinc-blende structure with numerous stacking faults in the bottom ZnTe part and near perfect crystalline structure in the top CdTe part. Energy dispersive X-ray spectroscopy (EDXS) and lattice fringe spacing analysis revealed nonabrupt nature of hetero−interface, whose width was estimated to be 50–70 nm for the nanowires having a diameter in the range from 40 to 50 nm.
- Subjects
NANOWIRES; MOLECULAR beam epitaxy; EPITAXY; X-ray spectroscopy; NANOSTRUCTURED materials
- Publication
Journal of Microscopy, 2010, Vol 237, Issue 3, p337
- ISSN
0022-2720
- Publication type
Article
- DOI
10.1111/j.1365-2818.2009.03256.x