Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleStructural Characterization of BaZrS<sub>(3-y)</sub>Se<sub>y</sub> Perovskite Thin Films via Scanning Transmission Electron Microscopy.AuthorsSimonian, Tigran; Xu, Michael; Sadeghi, Ida; Van Sambeek, Jack; Ye, Kevin; Jaramillo, Rafael; LeBeau, James M; Nicolosi, ValeriaSubjectsSCANNING transmission electron microscopy; PEROVSKITE; THIN films testingPublicationMicroscopy & Microanalysis, 2023, p1731ISSN1431-9276Publication typeAbstractDOI10.1093/micmic/ozad067.894