Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleQuantification of Thermal Interface Resistance Using Atomic Scale Debye-Waller Thermometry.AuthorsZhu, Menglin; Hwang, JinwooPublicationMicroscopy & Microanalysis, 2020, Vol 26, Issue S2, p960ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927620016499