We found a match
Your institution may have rights to this item. Sign in to continue.
- Title
Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer.
- Authors
Goncalves Hönnicke, Marcelo; Conley, Raymond; Cusatis, Cesar; Kakuno, Edson Massayuki; Juan Zhou; Bouet, Nathalie; Basso Marques, Joao; Cesar Vicentin, Flavio
- Abstract
In this work, soft X-ray back-diffraction (XBD; X-ray diffraction at angles near and exactly equal to 90°) is explored. The experiment was conducted at the SXS beamline at Laboratorio Nacional de Luz Sincrotron, Brazil, at ~3.2 keV. A high-resolution Si(220) multi-bounce back-diffraction monochromator was designed and constructed for this experiment. An ultra-thin Si(220) crystal (5 mm thick) was used as the sample. This ultra-thin crystal was characterized by profilometry, rocking-curve measurements and X-ray topography prior to the XBD measurements. It is shown that the measured forward-diffracted beam (obeam) profiles, taken at different temperatures, are in close agreement with profiles predicted by the extended dynamical theory of X-ray diffraction, with the absence of multiple-beam diffraction (MBD). This is an important result for future studies on the basic properties of back-diffracted X-ray beams at energies slightly above the exact XBD condition (extreme condition where XBD is almost extinguished). Also, the results presented here indicate that stressed crystals behave like ideal strain-free crystals when used for low-energy XBD. This is mainly due to the large widths of XBD profiles, which lead to a low strain sensitivity in the detection of defects. This result opens up new possibilities for mounting spherical analyzers without degrading the energy resolution, at least for low energies. This is a path that may be used to construct a soft inelastic X-ray scattering spectrometer where different applications such as element-specific magnetic imaging tools could be explored.
- Subjects
CRYSTALS spectra; X-ray diffraction; X-ray scattering; X-ray spectrometers; ELECTRON density; SILICON crystals
- Publication
Journal of Applied Crystallography, 2014, Vol 47, Issue 5, p1658
- ISSN
0021-8898
- Publication type
Article
- DOI
10.1107/S1600576714018147