We found a match
Your institution may have rights to this item. Sign in to continue.
- Title
Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram.
- Authors
Hellman, Olof C.; Vandenbroucke, Justin A.; Rüsing, Järg; Isheim, Dieter; Seidman, David N.
- Abstract
The three-dimensional (3D) atom-probe technique produces a reconstruction of the elemental chemical identities and three-dimensional positions of atoms field evaporated from a sharply pointed metal specimen, with a local radius of curvature of less than 50 nm. The number of atoms collected can be on the order of one million, representing an analysis volume of approximately 20 nm x 20 nm x 200 nm (80,000 nm³). This large amount of data allows for the identification of microstructural features in a sample, such as grain or heterophase boundaries, if the feature density is large enough. Correlation of the measured atomic positions with these identified features results in an atom-by-atom description of the chemical environment of crystallographic defects. This article outlines a data compilation technique for the generation of composition profiles in the vicinity of interfaces in a geometrically independent way. This approach is applied to quantitative determination of interfacial segregation of silver at a MgO/Cu(Ag) heterophase interface.
- Publication
Microscopy & Microanalysis, 2000, Vol 6, Issue 5, p437
- ISSN
1431-9276
- Publication type
Article
- DOI
10.1007/s100050010051