Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleCorrelation between hydroxyl fraction and O/Al atomic ratio as determined from XPS spectra of aluminium oxide layers.AuthorsJ. van den Brand; W. G. Sloof; H. Terryn; J. H. W. de WitPublicationSurface & Interface Analysis: SIA, 2004, Vol 36, Issue 1, p81ISSN0142-2421Publication typeArticleDOI10.1002/sia.1653