Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleDevelopment of High-Speed Scan System for Atomic Resolution STEM.AuthorsJimbo, Yu; Ishikawa, Ryo; Terao, Mitsuhisa; Nishikawa, Masashi; Morishita, Shigeyuki; Mukai, Masaki; Sawada, Hidetaka; Ikuhara, Yuichi; Shibata, NaoyaPublicationMicroscopy & Microanalysis, 2021, Vol 27, p2710ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927621009557