Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleTomographic imaging with single atom sensitivity using aberration-corrected STEM.Authorsvan Benthem, K.; Lupini, A. R.; Peng, Y.; Pennycook, S. J.PublicationMicroscopy & Microanalysis, 2005, Vol 11, p318ISSN1431-9276Publication typeArticleDOI10.1017/S143192760550223X