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- Title
In situ spectroscopic measurement of structural change in SiO<sub>2</sub> during femtosecond laser irradiation.
- Authors
Fukata, N.; Yamamoto, Y.; Murakami, K.; Hase, M.; Kitajima, M.
- Abstract
Spectra of light transmitted through SiO2 specimens were measured during irradiation of amplified 800 nm ultrashort (400 fs) laser with a repetition rate of 100 kHz. The spectra exhibit a broad dispersion including a peak at around 450 nm, and the peak wavelength and the intensity are found to significantly depend on the irradiation time. Positively charged oxygen vacancies (E′ center) and oxygen-deficiency centers (ODCs) with neutral charge were observed by electron spin resonance (ESR) and photoluminescence (PL), respectively, after irradiation. The formation of the E′ center and the subsequent transformation to ODCs significantly depend on the laser power density. The correlation between the intensity of the peak at around 450 nm and the ESR signal intensity of the E′ center, and also the observation of PL spectrum due to ODCs suggest that self-trapped excitons exhibiting the peak at around 450 nm are created through multi-photon absorption, followed by the formation of the E′ center, and this finally leads to the formation of ODCs.
- Subjects
SILICON oxide; IRRADIATION; OXYGEN; ELECTRON paramagnetic resonance; PHOTOLUMINESCENCE; SPECTRUM analysis
- Publication
Applied Physics A: Materials Science & Processing, 2004, Vol 79, Issue 4-6, p1425
- ISSN
0947-8396
- Publication type
Article
- DOI
10.1007/s00339-004-2802-z