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- Title
Control Charts for Joint Monitoring of the Lognormal Mean and Standard Deviation.
- Authors
Huang, Wei-Heng; Hryniewicz, Olgierd; Megahed, Fadel; Villaverde, Alejandro F; Odintsov, Sergei D.
- Abstract
The Shewhart X ¯ - and S-charts are most commonly used for monitoring the process mean and variability based on the assumption of normality. However, many process distributions may follow a positively skewed distribution, such as the lognormal distribution. In this study, we discuss the construction of three combined X ¯ - and S-charts for jointly monitoring the lognormal mean and the standard deviation. The simulation results show that the combined lognormal X ¯ - and S-charts are more effective when the lognormal distribution is more skewed. A real example is used to demonstrate how the combined lognormal X ¯ - and S-charts can be applied in practice.
- Subjects
STANDARD deviations; LOGNORMAL distribution; SKEWNESS (Probability theory); QUALITY control charts
- Publication
Symmetry (20738994), 2021, Vol 13, Issue 4, p549
- ISSN
2073-8994
- Publication type
Article
- DOI
10.3390/sym13040549