Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleFunctional mapping of N deficiency‐induced response in wheat yield‐component traits by implementing high‐throughput phenotyping.AuthorsJiang, Libo; Sun, Lidan; Ye, Meixia; Wang, Jing; Wang, Yaqun; Bogard, Matthieu; Lacaze, Xavier; Fournier, Antoine; Beauchêne, Katia; Gouache, David; Wu, RonglingPublicationPlant Journal, 2019, Vol 97, Issue 6, p1105ISSN0960-7412Publication typeArticleDOI10.1111/tpj.14186