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- Title
Improved Electrical Properties and Strong Red Emission of Pr<sup>3+</sup>-Doped x K<sub>0.5</sub> Bi<sub>0.5</sub> TiO<sub>3</sub>-(1− x) Na<sub>0.5</sub> Bi<sub>0.5</sub> TiO<sub>3</sub> Lead-Free Ferroelectric Thin Films.
- Authors
Zhou, Hong; Wu, Guangheng; Qin, Ni; Bao, Dinghua; Wang, H.
- Abstract
Structural, photoluminescence, dielectric, and ferroelectric properties of lead-free perovskite Pr3+-doped x K0.5 Bi0.5 TiO3-(1− x) Na0.5 Bi0.5 TiO3 ( x = 0-1.0) thin films were studied. The thin films were prepared by a chemical solution deposition method combined with a rapid thermal annealing process at 700°C. We observed that the thin film with x = 0.15, corresponding to the morphotropic phase boundary in the solid solution ceramics or single crystal bulk counterparts, showed a very large dielectric constant and a high remanent polarization, as well as a strong red emission at 611 nm assigned to 1D2→3H4 transitions of the Pr3+ ions. In addition, this study also indicates that the morphotropic phase boundary in x K0.5 Bi0.5 TiO3-(1− x) Na0.5 Bi0.5 TiO3 thin films might be probed by photoluminescence probe of Pr3+ ions because the photoluminescence of Pr3+ ions is very sensitive to the phase structure changes.
- Subjects
PEROVSKITE; FERROELECTRIC thin films; STRUCTURAL analysis (Science); PHOTOLUMINESCENCE measurement; ELECTRIC properties of thin films; THIN films; OPTICAL properties; LEAD-free electronics manufacturing processes
- Publication
Journal of the American Ceramic Society, 2012, Vol 95, Issue 2, p483
- ISSN
0002-7820
- Publication type
Article
- DOI
10.1111/j.1551-2916.2011.05028.x