Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleThreshold Conversion for Field Emission Scanning Electron Micrograph of Glass-Alumina Composites in Determining the Activated Interfaces.AuthorsYu, C. L.; Hao, X.; Jiang, H. T.; Wang, L. L.SubjectsFIELD emission; COMPOSITE materials; SINTERING; SCANNING electron microscopy; CRYSTALLIZATION; DIGITAL image processing; ALUMINUM oxidePublicationScience of Sintering, 2010, Vol 42, Issue 3, p297ISSN0350-820XPublication typeArticleDOI10.2298/SOS1003297Y