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MBE Growth of Strained HgTe/CdTe Topological Insulator Structures.
Published in:
Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2955, doi. 10.1007/s11664-014-3160-z
By:
- Ballet, P.;
- Thomas, C.;
- Baudry, X.;
- Bouvier, C.;
- Crauste, O.;
- Meunier, T.;
- Badano, G.;
- Veillerot, M.;
- Barnes, J.;
- Jouneau, P.;
- Levy, L.
Publication type:
Article
Dissipative phases across the superconductor-to-insulator transition.
Published in:
Scientific Reports, 2016, p. 35834, doi. 10.1038/srep35834
By:
- Couëdo, F.;
- Crauste, O.;
- Drillien, A. A.;
- Humbert, V.;
- Bergé, L.;
- Marrache-Kikuchi, C. A.;
- Dumoulin, L.
Publication type:
Article
EURECA - THE FUTURE OF CRYOGENIC DARK MATTER DETECTION IN EUROPE.
Published in:
EAS Publications Series, 2009, v. 36, p. 249, doi. 10.1051/eas/0936035
By:
- Kraus, H.;
- Armengaud, E.;
- Bauer, M.;
- Bavykina, I.;
- Benoit, A.;
- Bento, A.;
- Blümer, J.;
- Bornschein, L.;
- Broniatowski, A.;
- Burghart, G.;
- Camus, P.;
- Chantelauze, A.;
- Chapellier, M.;
- Chardin, G.;
- Ciemniak, C.;
- Coppi, C.;
- Coron, N.;
- Crauste, O.;
- Danevich, F. A.;
- De Jésus, M.
Publication type:
Article
Surface Event Rejection of the EDELWEISS Cryogenic Germanium Detectors Based on NbSi Thin Film Sensors.
Published in:
Journal of Low Temperature Physics, 2008, v. 151, n. 3/4, p. 835
By:
- S. Marnieros;
- L. Berge;
- A. Broniatowski;
- M. Chapellier;
- S. Collin;
- O. Crauste;
- X. Defay;
- Y. Dolgorouky;
- L. Dumoulin;
- A. Juillard;
- F. Lalu;
- C. Nones;
- E. Olivieri
Publication type:
Article

Found: 4

MBE Growth of Strained HgTe/CdTe Topological Insulator Structures.

Dissipative phases across the superconductor-to-insulator transition.

EURECA - THE FUTURE OF CRYOGENIC DARK MATTER DETECTION IN EUROPE.

Surface Event Rejection of the EDELWEISS Cryogenic Germanium Detectors Based on NbSi Thin Film Sensors.