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TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology.
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- Analytical & Bioanalytical Chemistry, 2009, v. 393, n. 8, p. 1917, doi. 10.1007/s00216-009-2657-4
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- Article
Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions.
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- Rapid Communications in Mass Spectrometry: RCM, 2008, v. 22, n. 10, p. 1481, doi. 10.1002/rcm.3533
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- Article