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- Title
Low refractive index contrast porous silicon omnidirectional reflectors.
- Authors
Xifré-Pérez, E.; Marsal, L.; Ferré-Borrull, J.; Pallarès, J.
- Abstract
We report on the fabrication and characterization of a porous silicon omnidirectional reflector formed by periodic substructures stacked together. For these substructures, a low refractive index contrast has been used, resulting in substructures without omnidirectional reflectivity band. The use of a low refractive index contrast involves the reduction of the requirements to obtain omnidirectional reflectors. We demonstrate the existence of an omnidirectional reflectivity range with a high gap-to-midgap ratio by means of reflectivity spectra measurements for a range of incidence angles. The results are in good agreement with a theoretical model of the reflector. The fabricated structure is the first reported porous silicon reflector suitable for 1.55 μm applications.
- Subjects
POROUS silicon; SEMICONDUCTORS; OPTICAL reflection; WAVELENGTHS; SPECTRUM analysis
- Publication
Applied Physics B: Lasers & Optics, 2009, Vol 95, Issue 1, p169
- ISSN
0946-2171
- Publication type
Article
- DOI
10.1007/s00340-009-3416-0