Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleTip characterizer for atomic force microscopy using singly suspended carbon nanotube.AuthorsInaba, Takumi; Xie, Jianping; Sugiyama, Ryohei; Homma, YoshikazuPublicationSurface & Interface Analysis: SIA, 2012, Vol 44, Issue 6, p690ISSN0142-2421Publication typeArticleDOI10.1002/sia.4813