Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleHard X-ray In-situ Full-field Microscopy for Material Science Applications.AuthorsSnigireva, Irina; Falch, Ken Vidar; Casari, Daniele; Di Michiel, Marco; Detlefs, Carsten; Mathiesen, Ragnvald; Snigirev, AnatolyPublicationMicroscopy & Microanalysis, 2018, Vol 24, p552ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927618014952