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- Title
43RD INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS CONFERENCE & EXPOSITION.
- Abstract
The article talks about the 43rd International Symposium for Testing and Failure Analysis (ISTFA), the premier conference and exhibition for microelectronics failure analysis community, would be held November 5-9, 2017 in Pasadena, California. The event would feature Display of failure analysis equipment in the industry with live demonstrations of the latest tools and technology. The schedule and itinerary of the event are mentioned.
- Subjects
MATERIALS science conferences; MATERIALS science; MATERIALS science periodicals; PERFORMANCE of electronics
- Publication
Advanced Materials & Processes, 2017, Vol 175, Issue 6, p33
- ISSN
0882-7958
- Publication type
Article