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Optical properties of cerium-doped SiNx thin films containing silicon nanocrystals.
Published in:
Applied Physics A: Materials Science & Processing, 2024, v. 130, n. 6, p. 1, doi. 10.1007/s00339-024-07550-3
By:
- Tiour, F.;
- Bekhedda, K.;
- Mahmoudi, B.;
- Menari, H.;
- Manseri, A.;
- Brik, A.;
- Mefoued, A.;
- Chetoui, A.;
- Menous, I.
Publication type:
Article
Elaboration and characterization of a-SiC nanowires for CO2 sensor.
Published in:
Applied Physics A: Materials Science & Processing, 2021, v. 127, n. 10, p. 1, doi. 10.1007/s00339-021-04912-z
By:
- Boukezzata, A.;
- Kebaili, A.;
- Bouhamed, A.;
- Bouanik, S.;
- Manseri, A.;
- Cheraga, H.;
- Kaci, S.;
- Guerbous, L.;
- Menari, H.
Publication type:
Article
Lithium-drifted, silicon radiation detectors for harsh radiation environments.
Published in:
Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 14, doi. 10.1007/s10854-008-9707-0
By:
- Grant, J.;
- Buttar, C.;
- Brozel, M.;
- Keffous, A.;
- Cheriet, A.;
- Bourenane, K.;
- Bourenane, A.;
- Kezzoula, F.;
- Menari, H.
Publication type:
Article
Texture etching of monocrystalline silicon surface with sodium hypochlorite.
Published in:
Surface Engineering, 2014, v. 30, n. 2, p. 148, doi. 10.1179/1743294413Y.0000000221
By:
- Lounas, A.;
- Nait Bouda, A.;
- Menari, H.;
- Belkacem, Y.;
- Gabouze, N.
Publication type:
Article
Effect of Rapid Thermal Processing on Light-Induced Degradation of Carrier Lifetime in Czochralski p-Type Silicon Bare Wafers.
Published in:
Journal of Electronic Materials, 2016, v. 45, n. 11, p. 5621, doi. 10.1007/s11664-016-4769-x
By:
- Kouhlane, Y.;
- Bouhafs, D.;
- Khelifati, N.;
- Belhousse, S.;
- Menari, H.;
- Guenda, A.;
- Khelfane, A.
Publication type:
Article
Study of the Influence of the Annealing Temperature on the Properties of SiC-SiO2 Thin Films.
Published in:
Acta Physica Polonica: A, 2020, v. 137, p. 499, doi. 10.12693/APhysPolA.137.499
By:
- BOZETINE, I.;
- KACI, S.;
- KEFFOUS, A.;
- RAHMOUNE, R.;
- MENARI, H.;
- MANSERI, A.
Publication type:
Article
Amorphous Silicon Carbide Nanowires for Optical Sensor Device.
Published in:
Acta Physica Polonica: A, 2020, v. 137, p. 447, doi. 10.12693/APhysPolA.137.447
By:
- BOUKEZZATA, A.;
- BOUANIK, S.;
- MANSERI, A.;
- KACI, S.;
- MENARI, H.;
- MAHMOUDI, B.
Publication type:
Article
Al-Assisted Photochemical Etching of a-SiC Thin Films for NH3 Sensor.
Published in:
Acta Physica Polonica: A, 2020, v. 137, p. 454, doi. 10.12693/APhysPolA.137.454
By:
- BOUKEZZATA, A.;
- MENARI, H.;
- KACI, S.
Publication type:
Article
STRUCTURAL AND OPTICAL PROPERTIES OF POLYCRYSTALLINE 6H-SiC AND CRYSTALLINE SiC FILM GROWN ONTO SILICON SUBSTRATE BY PLD.
Published in:
Modern Physics Letters B, 2008, v. 22, n. 1, p. 61, doi. 10.1142/S0217984908014559
By:
- KEFFOUS, A.;
- BOURENANE, K.;
- MANSERI, O.;
- MENARI, H.;
- KEZZOULA, F.;
- KECHOUANE, M.;
- BOURENANE, A.;
- KERDJA, T.;
- NEZZAL, G.;
- BOUKEZZATA, A.
Publication type:
Article
Study of optical properties of porous silicon by DFT, comparison to experimental and effective medium approximation methods.
Published in:
Bulletin of Materials Science, 2024, v. 47, n. 3, p. 1, doi. 10.1007/s12034-024-03189-1
By:
- Lachenani, H;
- Ouir, S;
- Boudeffar, F;
- Achacha, S;
- Menari, H;
- Krea, M;
- Gabouze, N
Publication type:
Article

Found: 10

Optical properties of cerium-doped SiN<sub>x</sub> thin films containing silicon nanocrystals.

Elaboration and characterization of a-SiC nanowires for CO<sub>2</sub> sensor.

Lithium-drifted, silicon radiation detectors for harsh radiation environments.

Texture etching of monocrystalline silicon surface with sodium hypochlorite.

Effect of Rapid Thermal Processing on Light-Induced Degradation of Carrier Lifetime in Czochralski p-Type Silicon Bare Wafers.

Study of the Influence of the Annealing Temperature on the Properties of SiC-SiO<sub>2</sub> Thin Films.

Amorphous Silicon Carbide Nanowires for Optical Sensor Device.

Al-Assisted Photochemical Etching of a-SiC Thin Films for NH<sub>3</sub> Sensor.

STRUCTURAL AND OPTICAL PROPERTIES OF POLYCRYSTALLINE 6H-SiC AND CRYSTALLINE SiC FILM GROWN ONTO SILICON SUBSTRATE BY PLD.

Study of optical properties of porous silicon by DFT, comparison to experimental and effective medium approximation methods.