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- Title
辉光放电质谱法测定高纯材料中痕量硫杂质.
- Authors
李铭; 刘国; 江鹏; 杨紫君; 莽雯倩; 高旭升; 周文斌
- Abstract
Accurate determination and control of impurity elements in materials is one of the keys to ensure the performance of high-purity materials. Glow discharge mass spectrometry(GDMS) is an ideal method for accurate, rapid and sensitive analysis of trace and ultra-trace sulfur in high-purity materials. The spectral interferences of sulfur in high-purity copper and nickel base super alloy were discussed in detail. The discharge parameters of GDMS, including discharge current and discharge voltage, were optimized. The relative sensitivity factor(RSF) of sulfur was calibrated and validated by a variety of standard reference materials. The relative deviations between the determination results by the calibrated RSF and the reference values of standard reference materials were-2.4% and-2.6%. The accuracy and reliability of GDMS were verified by comparing the results with secondary ion mass spectrometry(SIMS), the relative deviations of two real samples were-3.45% and-4.67%, respectively.
- Subjects
SECONDARY ion mass spectrometry; GLOW discharges; TRACE analysis; CHROMIUM-cobalt-nickel-molybdenum alloys; MASS spectrometry
- Publication
Chinese Journal of Inorganic Analytical Chemistry / Zhongguo Wuji Fenxi Huaxue, 2022, Vol 12, Issue 4, p126
- ISSN
2095-1035
- Publication type
Article
- DOI
10.3969/j.issn.2095-1035.2022.04.019