We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
DETERMINACIÓN DE FACTORES DE SENSIBILIDAD EDS, AES Y XPS DE ESTÁNDARES DE CuInSe<sub>2</sub> E In<sub>2</sub>Se<sub>3</sub>.
- Authors
Herrera-Gorocica, M. P.; Bartolo-Pérez, P.; Calderón, C.; Peña, J. L.
- Abstract
Solar cells based on thin film technology CuInSe2 are currently being studied extensively. The correct quantitative chemical analysis is very important for the appropriate functioning of this type of solar cells. Using high-purity CuInSe2 and In2Se3 standards the correct relative sensitivity factors for quantification with EDS, AES and XPS spectroscopy are determined. To correct EDS analysis of such thin films (> 0.5 ìm) is important to know about that penetrate deep where the electrons and X rays come from, so that these depths are determined by analytical formulas and Monte Carlo simulations. We compare the sensitivity factors obtained with those reported in the AES and XPS handbooks.
- Publication
Acta Microscopica, 2012, Vol 21, Issue 1, p15
- ISSN
0798-4545
- Publication type
Article