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- Title
Coupling of Electron Channeling with EBSD: Toward the Quantitative Characterization of Deformation Structures in the SEM.
- Authors
Gutierrez-Urrutia, I.; Zaefferer, S.; Raabe, D.
- Abstract
The coupling of electron channeling contrast imaging (ECCI) with electron backscatter diffraction (EBSD) provides an efficient and fast approach to perform ECCI of crystal defects, such as dislocations, cells, and stacking faults, under controlled diffraction conditions with enhanced contrast. From a technical point of view, the ECCI technique complements two of the main electron microscopy techniques, namely, EBSD and conventional diffraction-based transmission electron microscopy. In this review, we provide several application examples of the EBSD-based ECCI approach on microstructure characterization, namely, characterization of single dislocations, measurement of dislocation densities, and characterization of dislocation substructures in deformed bulk materials. We make use of a two-beam Bloch wave approach to interpret the channeling contrast associated with crystal defects. The approach captures the main features observed in the experimental contrast associated with stacking faults and dislocations.
- Subjects
CHANNELING (Physics); ELECTRONS; ELECTRON backscattering; CRYSTAL defects; TRANSMISSION electron microscopy; MICROSTRUCTURE; BULK solids
- Publication
JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2013, Vol 65, Issue 9, p1229
- ISSN
1047-4838
- Publication type
Article
- DOI
10.1007/s11837-013-0678-0